Annealing Effects on the Properties of Electrodeposited CdSSe Thin Films

Annealing Effects on the Properties of Electrodeposited CdSSe Thin Films

T. MahalingamV. Dhanasekaran S. Rajendran G. Ravi Luis Ixtlilco P. J. Sebastian 

Department of Physics, Alagappa University, Karaikudi - 630 003

Universidad Politécnica del Estado de Guerrero, Carretera Taxco-Iguala, Ejido de Arroyo s/n, CP. 40290, Taxco, Guerrero

Solar-Hydrogen-Fuel Cell Group, CIE-UNAM, Temixco 62580, Morelos

Corresponding Author Email:
17 June 2011
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The effect of post heat treatment on structural, morphological and optical properties of electrodeposited CdSSe solid solution thin films were studied using X-ray diffractometer (XRD), scanning electron microscopy (SEM), and UV-Vis-NIR spectrophotometer, respectively. X-ray diffraction patterns revealed that polycrystalline nature with hexagonal structure of CdSSe thin films.  Also the microstructural properties are calculated tends to increase and the face centred hexagonal orientation of CdSSe thin film is enhanced significantly by increasing the annealing temperature. Scanning electron microscopic images revealed that the hexagonal shaped grains are occupying the entire surface of the film. The optical transmittance and absorption spectra were recorded in the range 400 to1100 nm. The band gap of the CdSSe thin films was found to decrease from 2.0 eV to 1.8 eV due to annealing temperature. The real part of the complex refractive index (n) and the imaginary part extinction coefficient (k) were calculated before and after annealing.


thin films, electrodeposition, cdSSe, semiconductor

1. Introduction
2. Experimental Details
3. Results and Discussion
4. Conclusions

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