Thin films of copper indium telluride were electrodeposited on indium doped tin oxide coated conducting glass (ITO) substrates at various bath temperatures and deposition potentials from an aqueous acidic bath containing CuSO4, In2(SO4)3 and TeO2. The deposited films were characterized by x-ray diffraction, scanning electron microscopy, energy dispersive analysis of x-rays and optical absorption techniques, respectively. The film structure was found to be cubic with preferential orientation along (200) plane. Using x-ray diffraction data the microstructural parameters such as crystallite size, strain, dislocation density and stacking fault probability were calculated. The variation of microstructural parameters with bath temperature and deposition potential were studied. The experimental observations are discussed in detail.
thin films, CuInTe2, x-ray diffraction, microstructural parameters, optical properties, surface morphology.
One of the authors (S.Thanikaikarasan) is highly thanks to Council of Scientific and Industrial Research (CSIR), New Delhi for the award of Senior Research Fellowship (SRF) to carry out this research work.
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