Parametric accelerated life testing (ALT) with the reliability quantitative (RQ) specifications is rec- ommended as reliability methodology to pinpoint design flaws and correct them in transit. It covers (1) cycles of an accumulated failure rate of X% (BX) lifetime with ALT strategy, (2) fatigue design, (3) ALTs with alterations, and (4) discernment if design(s) obtains targeted BX life. The quantum/ transport-based (generalized) life-stress failure prototype and sample size formulation for generating RQ specifications were suggested. The equivalent elevated damage potential in parametric ALT was applied, represented by field power spectral density. A case study was used to evaluate a refrigerator fatigued during rail. In first ALT, for RQ specifications – 40 min, refrigerator tubes made of ethylene propylene diene monomer rubber fractured because of mount designs. The failed shape in first ALT was alike to those of the field refrigerator. After mounts and tubes were redesigned, there were no dif- ficulties during second ALT. Refrigerator was assured to fulfill a B1 lifetime for travel distance.
design flaws, fatigue, parametric accelerated life testing, quantum/transport-based life-stress model, random vibration, sample size equation
 Woo, S., Pecht, M. & O’Neal, D., Reliability design and case study of the domestic compressor subjected to repetitive internal stresses. Reliability Engineering & System Safety, 193, p. 106604, 2020. https://doi.org/10.1016/j.ress.2019.106604
 Duga, J. J., Fisher, W. H., Buxaum, R. W., Rosenfield, A. R., Buhr, A. R., Honton, E.J.& McMillan, S. C., The Economic Effects of Fracture in the United States, Final Report, Battelle Laboratories, Columbus, OH. Available as NBS Special Publication, September 30, 1982.
 Weingart, R. G. & Stephen, P., Timoshenko: Father of Engineering Mechanics in the U.S. Structure Magazine, 1 August 2007.
 Lalanne, C., Mechanical Vibration and Shock Analysis, Specification Development. Volume 5. 3rd ed. Hoboken (NJ): John Wiley & Sons, Inc., 2014.
 Elsayed, E. A., Reliability Engineering. 3rd ed. Hoboken (NJ): John Wiley & Sons, Inc.; 2021.
 Hahn, G. J. & Meeker, W. Q., How to Plan an Accelerated Life Test (E-Book). Milwaukee: ASQ Quality Press, 2004.
 Miner, M. A., Cumulative damage in fatigue. Journal of Applied Mechanics, 12, pp. 149–164, 1945. https://doi.org/10.1115/1.4009458
 Grove, A., Physics and Technology of Semiconductor Device. 1st Ed. Wiley International Edition, 1967.