Thermophysical Characterization of Conductive Thin Films

Thermophysical Characterization of Conductive Thin Films

J. FaouelF. Mzali A. Jemni S. Ben Nasrallah 

Laboratoire d’Etudes des Systèmes Thermiques et Energétiques, Ecole Nationale d’Ingénieurs de Monastir, Avenue Ibn ElJazzar, Monastir, 5019, Tunisia

Corresponding Author Email: 
faoueljihen@yahoo.fr, foued.mzali@enim.rnu.tn
Page: 
17-22
|
DOI: 
https://doi.org/10.18280/ijht.300103
Received: 
N/A
|
Accepted: 
N/A
|
Published: 
30 June 2012
| Citation

OPEN ACCESS

Abstract: 

In this paper thermal properties of conductive thin films on aluminium substrate are investigated using a phototyhermal method. In the first case the film thermal conductivity and heat capacity, the thermal contact resistance between thin and substrate and the convective heat transfer coefficient are simultaneously estimated. Secondly, the case of anisotropic thin films is studied. In that case, axial and radial thermal conductivities and the heat capacity of the thin film are simultaneously determined with the convective heat transfer coefficient. For the parameter estimation an inverse technique, based on Levenberg-Marquardt algorithm, is performed. liquids, conductive heat transfer, thermal characterization, parameter estimation, photothermal technique.

Keywords: 

thin film, thermal anisotropy, thermal conductivity, photothermal method

1. Introduction
2. Direct Problem
3. Inverse Problem
4. Results and discussion
5. Conclusions
  References

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